Influence of BTS electromagnetic fields on the series and shunt resistances of photovoltaic modules under real operating conditions

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Résumé

This study investigates the influence of electromagnetic fields emitted by Base Transceiver Station (BTS) antennas on the electrical behavior and energy conversion performance of photovoltaic (PV) modules under real operating conditions. Particular attention is given to the evolution of the series resistance (Rs) and shunt resistance (Rsh), which are key parameters governing PV efficiency and carrier transport mechanisms. The theoretical framework for determining electromagnetic field components is presented together with the models used for extracting Rs and Rsh. An in-situ experimental campaign was conducted near a multi-technology BTS installation, and the measurement setup and extraction procedures are detailed. The results reveal that electromagnetic exposure induces nonlinear modifications in the resistive behavior of PV modules. Significant fluctuations in differential resistance are observed at short distances from the BTS antenna, particularly at low operating voltages where carrier transport is highly sensitive to external perturbations. At d = 27.64 m, corresponding to the main lobe footprint of the BTS radiation pattern and the maximum electromagnetic field intensity, the minimum values of both
Rs and Rsh are recorded. This behavior suggests enhanced carrier transport accompanied by increased leakage current effects under strong electromagnetic exposure. The findings further demonstrate that the maximum degradation of PV electrical performance does not occur at the shortest antenna distance, but rather at a critical exposure distance determined by the antenna radiation characteristics. Despite environmental uncertainties, the observed trends support the existence of a field-dependent and potentially reversible interaction between electromagnetic radiation and PV electrical parameters.

Mots-clés

Silicon PV module; Electromagnetic field; Differential resistance; Series and shunt resistances; Conversion efficiency